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Material Analysis Applications
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Material Analysis Applications
Technique
Title
FTIR
Overview of the Various Options for Time Course Measurement using FTIR
FTIR Microscopy
IR Microscope with Heating/Cooling Stage for the Evaluation of the Melting Point or Phase Transition of a Sample at the Molecular Level
FTIR
Micro Sample Analysis using ATR PRO ONE VIEW
FTIR
Analysis of the Deterioration of Industrial Grease using ATR
FTIR
Fiber Product Analysis using ATR PRO ONE VIEW
UV-Visible/NIR
High Sensitivity Near Infrared Absolute Reflectance Measurement of Materials
UV-Visible/NIR
Haze Measurement using a UV-Visible Spectrophotometer
UV-Visible/NIR
Evaluation of Anti-Reflection Films using Absolute Reflectance Measurement
Fluorescence
Internal Quantum Efficiency Measurement of Phosphor Powders
UV-Visible/NIR
Color Analysis using a UV-Visible Spectrophotometer
Fluorescence
Evaluation of FRET as a Sensitive Biosensor for Explosives
UV-Visible/NIR
Absolute Reflectance Measurement of a Dichroic Mirror using UV-Visible/NIR Spectroscopy
UV-Visible/NIR
Luminous Color Measurement by UV-Visible Spectroscopy
UV-Visible/NIR
Evaluation of Solar Heat Gain Coefficient and Transmittance, Reflectance & Emittance Measurement of Flat Glass by UV-Visible/NIR Spectroscopy
UV-Visible/NIR
Evaluation of Solar Reflective Paint by UV-Visible/NIR Spectrosopy
UV-Visible/NIR
Horizontal Integrating Sphere for Contact Lens Measurement
Fluorescence
Remote Measurement using FP-8500 Fluorometer with Optical Fiber
FTIR, Raman
Two Dimensional Correlation Spectroscopy using IR and Raman with Time-Course Measurement (Analysis of Cyanoacrylate Adhesive during Curing Process)
Fluorescence
Near-Infrared Phosphor Measurement
Fluorescence
Absolute Quantum Yields Using an Integrating Sphere
Fluorescence
Quantum Efficiency of Phosphorescent Materials using an Integrating Sphere
Fluorescence
High-Speed Measurement and EEM Interpretation for Olive Oil Analysis
Fluorescence
Determination of the Relative Quantum Yield of Rhodamine B
Fluorescence
Quantum Yield Measurement of the Up-Conversion Phosphors
Film Thickness, FTIR
Measurement of Thin Films by Polarization-Modulation Infrared Reflection-Absorption Spectroscopy (PM-IRRAS)
FTIR
p-Polarized MAIRS – Multiple Angle Incident Angle Resolution Spectroscopy
Raman
The Use of Dual Spatial Filtration to Improve Spatial Resolution in Raman Imaging Micro-spectroscopy
FTIR
IRT-5000 FTIR Microscope with IQ Mapping
Raman
Carbon Nanotube Analysis by Raman Spectroscopy
FTIR
MCR Chemometric Modeling for FTIR Imaging Microscopy
UV-Visible/NIR
Transmission Measurement of Volvox Algae Using the MSV-5000 Series
UV-Visible/NIR
Estimation of the Refractive Index of a Monocrystalline Sapphire via Polarization Measurement using the MSV-5000 Series Microscopic Spectrophotometer
SFC
The Analysis of Polymer Additives using Supercritical Fluid Chromatography
FTIR
Advanced FTIR Imaging System with Linear Array MCT Detector
UV-Visible/NIR
Evaluation of Solar Cells using Absolute Reflectance with a UV-Visible/NIR Spectrophotometer
FTIR, Portable FTIR
Field-Rugged FTIR Microscope for On-Site Analysis
Raman
Raman Analysis of Injection Molding -measurement of the polymer state during a process
FTIR
On-Line FTIR monitoring with a field-rugged spectrometer with fiber-optic cable
FTIR
Field-rugged FTIR for in-situ monitoring of chemical vapor deposition (CVD)
UV-Visible/NIR
Color Analysis of Fluorescence Materials for FPD
UV-Visible/NIR
Monitoring of Polysilicon Crystallization Using a Laser
UV-Visible/NIR
UV-Visible Diode-Array Spectrophotometer for In-Line Monitoring for QC
UV-Visible/NIR
On-line Monitoring of an Amorphous Silicon Layer on a Solar Cell
Raman
Using a 785nm laser to reduce fluorescence in Raman analysis of a contaminant in a film
Raman
Confocal Raman microscopy for non-destructive analysis of impurities in polymers
FTIR
FTIR Linear Array Microscope for Qualitative Analysis of Semiconductor Contaminants
UV-Visible/NIR
Highly Accurate Measurements in the Vacuum UV Region
UV-Visible/NIR
Transmittance Near-field measurements in the UV-visible/NIR range at 0.1 to 1 µm spatial resolution
UV-Visible/NIR
Evaluation of Micro Optics
UV-Visible/NIR
Evaluation of Polarizers for FPDs
UV-Visible/NIR
Phase Difference Measurements
Fluorescence
Luminescent Color Evaluation for Fluorescent Materials
UV-Visible/NIR
Evaluation of ITO Films
Fluorescence
Analysis of Fluorescence Materials at High Temperatures
Raman
Raman for the evaluation of carrier concentrations in GaN
Raman
Evaluation of Polysilicon
Raman
Single-Layer Carbon Nanotube
Raman
Evaluation of Carbon Materials
Raman
Evaluation of Diamond Like Carbon (DLC)
Raman
Semiconductor Stress Measurement
FTIR
FTIR Analysis of Si Wafer Surface Using a 65-Degree Incident Angle ATR
FTIR
Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory
FTIR
Terahertz ATR Measurement of Liquids by Vacuum FTIR
FTIR
Analysis of silicon wafers by vacuum FTIR
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